Atomic Force Microscopy: A Key Tool for Nanoscale Exploration
Atomic Force Microscopy (AFM) is one of the most powerful and versatile techniques used to study surfaces at the nanoscale. It provides highly detailed images by scanning a sharp probe over a material’s surface, enabling researchers to visualize structures with atomic-level precision. Since its invention in the 1980s, AFM has become a cornerstone technology in nanoscience, materials research, biology, and semiconductor development.
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